linux-loongson/Documentation/devicetree/bindings/soc/ti/ti,j784s4-bist.yaml
Neha Malcom Francis 04ee170b69 dt-bindings: soc: ti: bist: Add BIST for K3 devices
Document the binding for TI K3 BIST (Built-In Self Test) block.

Reviewed-by: Krzysztof Kozlowski <krzysztof.kozlowski@linaro.org>
Signed-off-by: Neha Malcom Francis <n-francis@ti.com>
Link: https://lore.kernel.org/r/20250605063506.2005637-2-n-francis@ti.com
Signed-off-by: Vignesh Raghavendra <vigneshr@ti.com>
2025-07-09 11:37:13 +05:30

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YAML

# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause)
# Copyright (C) 2025 Texas Instruments Incorporated
%YAML 1.2
---
$id: http://devicetree.org/schemas/soc/ti/ti,j784s4-bist.yaml#
$schema: http://devicetree.org/meta-schemas/core.yaml#
title: Texas Instruments K3 BIST
maintainers:
- Neha Malcom Francis <n-francis@ti.com>
allOf:
- $ref: /schemas/arm/keystone/ti,k3-sci-common.yaml#
description:
The BIST (Built-In Self Test) module is an IP block present in K3 devices
that support triggering of BIST tests, both PBIST (Memory BIST) and LBIST
(Logic BIST) on a core. Both tests are destructive in nature. At boot, BIST
is executed by hardware for the MCU domain automatically as part of HW POST.
properties:
compatible:
const: ti,j784s4-bist
reg:
maxItems: 2
reg-names:
items:
- const: cfg
- const: ctrl_mmr
clocks:
maxItems: 1
power-domains:
maxItems: 1
required:
- compatible
- reg
- reg-names
- ti,sci-dev-id
unevaluatedProperties: false
examples:
- |
#include <dt-bindings/soc/ti,sci_pm_domain.h>
bus {
#address-cells = <2>;
#size-cells = <2>;
safety-selftest@33c0000 {
compatible = "ti,j784s4-bist";
reg = <0x00 0x033c0000 0x00 0x400>,
<0x00 0x0010c1a0 0x00 0x01c>;
reg-names = "cfg", "ctrl_mmr";
clocks = <&k3_clks 237 7>;
power-domains = <&k3_pds 237 TI_SCI_PD_EXCLUSIVE>;
ti,sci-dev-id = <234>;
};
};